Amid an upswing in anti-Asian hate crimes in America, a new exhibition at New York’s prestigious Fashion Institute of Technology will celebrate Asian American designers’ contribution to the fashion world.
Asian American in New York Fashion: Design, Labour and Innovation will run until 27 March and features the work of Shail Upadhya and Vivienne Tam. Designers Anna Sui and Zang Toi, meanwhile, feature in a sketch by artist Ruben Toledo.